The Hitachi TM-3030Plus Desktop Scanning Electron Microscope is a unit type microscope manufactured in Japan. It is designed for high-resolution imaging and analysis in various fields such as research, education, and industry. This SEM model offers advanced imaging capabilities and precise results, making it a valuable instrument in the scientific community.

It has a premium SE detector which has been incorporated in FE-SEM and VP SEM, and well accepted by users as a high sensitivity detector. It can be operated effectively under a low-vacuum and allows for quick SE image observation without specimen preparation.

Can be demonstrated at our Tustin, CA office.