Scanservice Corporation has several Scanning Electron Microscopes of different capabilities for sale to meet the diverse and complex challenges of materials science, biological research, medical research, nanotechnology, and industrial manufacturing in the semi-conductor field. To see each instrument in detail, click on the products below:
FEI Dual Beam 835
The FEI Dual Beam is a wafer handling system with gas injection.
This Hitachi S-3600N is great for large samples and can achieve resolution of 3nm. Capable of samples as thick as 70mm. Has a large stage traverse for higher throughput.
Hitachi S-3000H SEM
This Hitachi S-3000H SEM is great for high resolution imaging with quick pump down times for increased throughput. Incredibly reliable and durable instrument.
Hitachi S-5200 FE-SEM
An ultra-high resolution Field Emission SEM for cross-section morphology, layer thickness, etch profiles, and much more.
Hitachi S-4800-II FE-SEM
An ultra-high resolution field emission SEM that utilizes beam deceleration for high resolution at low kV.
Pelco SC-4 Sputter Coater
The Pelco SC-4 Sputter Coater is used for coating SEM samples with gold for imaging. In great condition.
Hitachi S-4700-II with Oxford EDS
The Hitachi S-4700 is a cold field emission SEM capable of high resolution imaging. It is equipped with a sample exchange chamber as well as an Oxford EDS system.
FEI Quanta 400 SEM
The Quanta 400 SEM is a Plug-and-Play system with no need for compressed air or water for cooling.
FEI Nova NanoLab 400 Dual Beam
The FEI Nova NanoLab 400 is a dual beam high-resolution FIB/SEM equipped with a field emission gun.
FEI Nova NanoSEM 230
The FEI Nova NanoSEM is a high quality Schottky Field Emission SEM equipped with a motorized stage for quick and easy imaging.
FEI Heated Stage
The FEI Heated Stage for use with the Quanta 200 or Quanta 400.
Hitachi TM-1000 Tabletop SEM
A compact and affordable SEM capable of high quality imaging in a compact space.
FEI Sirion — Windows 7
The FEI Sirion is a modern field emission microscope that's great for examining uncoated samples at low kV and high magnification.
FEI Quanta 600 ESEM
The Quanta 600 ESEM can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.
Zeiss EVO 50 with Oxford EDS
The Zeiss EVO 50 is equipped with ports for up to four secondary detectors with a multi-sample holder, making it great for analysis of multiple samples while being fully automated through software.
Phillips XL-30 Sirion FE-SEM with EDAX
This XL-30 Sirion is equipped with EDAX EDS. Designed with a user-friendly GUI that is great for any user, but powerful enough for an expert.
XL-30 FEG SEM with EDAX Detector
The FEI XL-30 Scanning Electron Microscope is the conventional SEM of the XL Series and it is suitable for a wide variety of applications.
Hitachi S-3000H SEM
This SEM has been designed to provide exceptional ease of use and expansiveness for future needs.
Hitachi S-3600N SEM with EDAX EDS
This SEM is equipped to image in high vacuum and low vacuum to accommodate samples that must be imaged at close to their natural state.
Hitachi S-3500N SEM with PGT EDS
The S-3500N has all the standard features of the S-3000N, but benefits from a chamber that can accept samples up to 8" in diameter. The Hitachi S3500N SEM provides a variable pressure mode of operation that allows microscopy of wet, oily and non-conductive samples.
FEI Tecnai G2 TEM
The FEI Tecnai G2 Transmission Electron Microscope (TEM) offers a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.
Hitachi S-2700 SEM
Hitachi S-2700 was developed for high resolution Scanning Electron Microscopy, which offers enhanced resolution and improved imaging in comparison to standard tungsten-filament systems, and no dark room required.